Fringe pattern analysis : 8-9 August 1989, San Diego, California / Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations : Applied Optics Laboratory/New Mexico State University [and others].

Published:: Bellingham, Wash., USA : SPIE--the International Society for Optical Engingineering, [1989]
Copyright Date:: ©1989
Physical Description:: vi, 260 pages : illustrations ; 28 cm.
Additional Creators:: Reid, Graeme T. and Society of Photo-optical Instrumentation Engineers

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0819401994 (pbk.)

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Includes bibliographical references.

View MARC record | catkey: 1027917