EUV, x-ray and gamma-ray instrumentation for astronomy and atomic physics / Charles J. Hailey, Oswald H.W. Siegmund, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others].

Published: Bellingham, Wash., USA : SPIE, [1989]
Copyright Date: ©1989
Physical Description: x, 680 pages : illustrations ; 28 cm.
Additional Creators: Hailey, Charles J., Siegmund, Oswald H. W., Society of Photo-optical Instrumentation Engineers, and New Mexico State University. Applied Optics Laboratory

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ISBN

0819401951

Note

At head of title: Proceedings / SPIE--the International Society for Optical Engineering.
"7-11 August 1989, San Diego, California".

Bibliography Note

Includes bibliographical references.

View MARC record | catkey: 1099488

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