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Advances in X-Ray Analysis [electronic resource] : Volume 15 / edited by Kurt F. J. Heinrich, Charles S. Barrett, John B. Newkirk, Clayton O. Ruud

Author
Heinrich, Kurt F. J.
Published
Boston, MA : Springer US : Imprint: Springer, 1972.
Physical Description
online resource
Additional Creators
Barrett, Charles S., Newkirk, J. B. (John B.), Ruud, C. O., and SpringerLink (Online service)
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Contents
The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry — A Review -- Detection of Single Ions by Pulse Counting: Application to Ion Microprobe Mass Analyzer -- Application of Computers in Electron Probe and X-Ray Fluorescence Analysis -- Computer-Controlled X-Ray and Neutron Diffraction Experiments -- An Automated Two-Crystal Spectrometer Employing Direct Angular Positioning and Readout -- A Paper Tape Controlled X-Ray Diffractometer for the Measurement of Retained Austenite -- Automated X-Ray Diffraction Laboratory System -- X-Ray Diffraction Topography-Differential Omega Scanning Technique -- A Modular Automatic X-Ray Analysis System -- An Automated Electron Microprobe System -- Rapid Quantitative Analysis by X-Ray Spectrometry -- On the Method of Variable Take-Off Angle for Quantitative X-Ray Fluorescence Analysis (XRFA) -- An Automatic X-Ray Analytical Instrument for the Chemical Laboratory -- Energy Dispersive Analysis for Adjacent Elements Using Two Single Channel Analyzers -- Determination of Zirconium, Hafnium, Niobium, Tantalum, Molybdenum and Tungsten in Aqueous Solutions by Radioisotopic Excited X-Ray Fluorescence -- Fluorescence Analysis Using an Si (Li) X-Ray Energy Analysis System with Low-Power X-Ray Tubes and Radioisotopes -- Rapid Recording of Powder Diffraction Patterns with Si(Li) X-Ray Energy Analysis System: W and Cu Targets and Error Analysis -- A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis -- Small X-Ray Tubes for Energy Dispersive Analysis Using Semiconductor Spectrometers -- Rapid Analysis of Mn in Plain Carbon Steels by Nondispersive X-Ray Fluorescence Spectroscopy -- The Use of Field Emission Tubes in X-Ray Analysis -- Old Errors and New Corrections in X-Ray Line Profile Analysis -- The Effects of Self-Irradiation on the Lattice of 238(80%)PuO2 -- The Disorder-Order Transformation in Ni4Mo -- A Strategy for Rapid and Accurate (p.p.m.) Measurement of Lattice Parameters of Single Crystals by Bond’s Method -- X-Ray Spectral Distributions from Thick Tungsten Targets in the Energy Range 12 to 300 kV -- Elemental X-Ray Cross Sections at Selected Wavelengths -- A Computerized Technique of Plotting a Complete Pole Figure by an X-Ray Reflection Method -- Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis -- Use of a Solid-State Detector for the Analysis of X-Rays Excited in Silicate Rocks by Alpha-Particle Bombardment -- Studies of X Rays Induced by Charged Particles -- Evaluation of X-Ray Image Intensifiers as Detectors for X-Ray Astronomy -- An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature -- Proposed Flash X-Ray System for X-Ray Diffraction with Submicrosecond Exposure Time -- Analysis of Solid Surfaces by Soft X-Ray Appearance Potential Spectroscopy -- Detector Background and Sensitivity of Semiconductor X-Ray Fluorescence Spectrometers -- The Measurement of Surface-Layer Stresses in a Polycrystalline Glass by Means of X-Ray Diffraction -- The Determination of the Axis of Lattice Rotation with Respect to a Change in Texture -- Simultaneous Spiral Recording of Pole Figures on Polaroid Film for Texture Goniometers -- X-Ray Double Crystal Diffractometer Investigations of Implanted Silicon: D+ and N+ -- X-Ray Investigations of Spinel Substrates -- Cross Linking of Collagen by Hydrophobe Bonds -- Effect of Ion Exchange Resin Particle Size on X-Ray Fluorescent Analysis -- On-Line Process Control Compositional Analysis of Aluminum Films Containing a Low Percentage of Copper -- Flame Technique for High Temperature Single Crystal Weissenberg Photography (1000–3000°C).
Subject(s)
ISBN
9781461399667
Digital File Characteristics
text file PDF
Note
AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
Part Of
Springer eBooks
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