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Modes de défaillance induits par l'environnement radiatif naturel dans les mémoires DRAMs [electronic resource] : étude, méthodologie de test et protection / Bougerol, Antonin

Author:: Bougerol, Antonin
Published:: [S.l.] : University Grenoble, 2011.
Access Online:: serialssolutions.com

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View MARC record | catkey: 12162085