LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE
- Conference Author:
- Test Conference (10th : 1979 : Cherry Hill Township, N.J)
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : Available from IEEE Computer Society Publications Office, 
- Copyright Date:
- Physical Description:
- ii, 382 pages : illustrations ; 28 cm
- Additional Creators:
- IEEE Computer Society. Test Technology Committee
Institute of Electrical and Electronics Engineers. Philadelphia Section
- Related Titles:
- IEEE 1979 Semiconductor Test Conference
On spine: IEEE 1979 Semiconductor Test Conference.
- Bibliography Note:
- Includes bibliographical references.
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