IEEE standard test access port and boundary-scan architecture / sponsor, Test Technology Technical Committee of the IEEE Computer Society

Published:: New York, N.Y., USA : Institute of Electrical and Electronics Engineers, [1990]
Copyright Date:: ©1990
Physical Description:: 1 volume (various pagings) : illustrations ; 28 cm.
Additional Creators:: IEEE Standards Board and IEEE Computer Society. Test Technology Technical Committee

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"Approved February 15, 1990, IEEE Standards Board".

View MARC record | catkey: 1362461