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Diffusion-Time-Resolved Ion-Beam-Induced Charge Collection from Stripe-Like Test Junctions Induced by Heavy-Ion Microbeams [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy, 2000.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
17 pages : digital, PDF file
Additional Creators
Sandia National Laboratories, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Free-to-read Unrestricted online access
Summary
No abstract prepared.
Report Numbers
E 1.99:sand2000-2291c
sand2000-2291c
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
09/18/2000.
"sand2000-2291c"
ICNMTA 2000, Bordeaux (FR), 09/10/2000--09/15/2000.
DUGGAN,J.L.; DOYLE,BARNEY L.; BOUANI,M. EL; GUO,B.N.; MCDANIEL,F.D.; WALSH,DAVID S.; RENFROW,STEVEN NEAL; NIGAM,M.
Funding Information
AC04-94AL85000
View MARC record | catkey: 13805958