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Structural Comparison of n-type and p-type LaAlO3/SrTiO3 Interfaces [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy, 2011.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Additional Creators
SLAC National Accelerator Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
Using a surface x-ray diffraction technique, we investigated the atomic structure of two types of interfaces between LaAlO₃ and SrTiO₃, that is, p-type (SrO/AlO₂) and n-type (TiO₂/LaO) interfaces. Our results demonstrate that the SrTiO₃ in the sample with the n-type interface has a large polarized region, while that with the p-type interface has a limited polarized region. In addition, the atomic intermixing was observed to extend deeper into STO substrate at the n-type interface than at the p-type. These differences result in different degrees of band bending, which likely contributes to the striking difference in electrical conductivity between the two types of interfaces.
Report Numbers
E 1.99:slac-pub-14503
slac-pub-14503
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Note
Published through SciTech Connect.
08/19/2011.
"slac-pub-14503"
Submitted to Physical Review Letters FT
Bell, Christopher.
Funding Information
AC02-76SF00515
View MARC record | catkey: 13820614