Researchers Demonstrate Microstructure and Charge Yield in Semiconducting Polymers (Fact Sheet), NREL Highlights, Science [electronic resource].
- Washington, D.C. : United States. Dept. of Energy. Office of Energy Efficiency and Renewable Energy, 2012.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 1 pg : digital, PDF file
- Additional Creators:
- National Renewable Energy Laboratory (U.S.)
United States. Department of Energy. Office of Energy Efficiency and Renewable Energy
United States. Department of Energy. Office of Scientific and Technical Information
- Microstructure determines the yield of free charge in neat semiconducting polymers. Understanding the fundamental photophysics of poly(3-hyxylthiophene) films, and that of conjugated polymers in general, is essential if we are to realize their full potential as low-cost active layers for coal-competitive solar power generation. Yet, the value of one of the most basic photophysical parameters of these materials - the yield of free charges upon photoexcitation of neat films - has remained controversial because of a wide variation between previous measurements. Researchers at the National Renewable Energy Laboratory (NREL) have resolved this controversy by showing that the yield of free charges depends sensitively on the solid-state microstructure of the film. The microstructure was varied systematically through control of the polymers molecular weight and processing conditions, while the charge carrier yield was measured using time-resolved microwave conductivity - a unique technique to which only a few groups in the world have access. The researchers found that the yield of long-lived free charges depends on the co-existence of amorphous and crystalline domains in the polymer, and this behavior was attributed to charge separation at the interface between these two domains of order.
- Published through SciTech Connect.
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