Sharp Reduction of the Secondary Electron Emission Yield from Grooved Surfaces [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 2007.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 18 pages : digital, PDF file
- Additional Creators:
- Stanford Linear Accelerator Center
United States. Department of Energy
United States. Department of Energy. Office of Scientific and Technical Information
- The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations.
- Published through SciTech Connect.
Journal of Applied Physics ISSN 0021-8979; JAPIAU FT
Kirby, R.E.; King, F.K.; Stupakov, G.; Pivi, M.T.F.; Le Pimpec, F.; Ruabenheimer, T.O.
- Funding Information:
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