Defect induced failure mechanisms accelerated by environmental stress screening / B.R. Livesay

Author:: Livesay, B. R.
Published:: Atlanta, Ga. : Georgia Institute of Technology : Georgia Tech Research Institute, [1990?]
Physical Description:: 121 leaves : illustrations ; 29 cm
Additional Creators:: Institute of Environmental Sciences

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"Prepared for tutorial program, Institute of Environmental Sciences annual meeting, New Orleans, April 23, 1990".

View MARC record | catkey: 1392708