Actions for Atomic Resolution Imaging with a sub-50 pm Electron Probe [electronic resource].

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Atomic Resolution Imaging with a sub-50 pm Electron Probe [electronic resource].

Published
Berkeley, Calif. : Lawrence Berkeley National Laboratory, 2009.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
4 : digital, PDF file
Additional Creators
Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
Using a highly coherent focused electron probe in a 5th order aberration-corrected transmission electron microscope, we report on resolving a crystal spacing less than 50 pm. Based on the geometrical source size and residual coherent and incoherent axial lens aberrations, an electron probe is calculated, which is theoretically capable of resolving an ideal 47 pm spacing with 29percent contrast. Our experimental data show the 47 pm spacing of a Ge 114 crystal imaged with 11-18percent contrast at a 60-95percent confidence level, providing the first direct evidence for sub 50-pm resolution in ADF STEM imaging.
Report Numbers
E 1.99:lbnl-1908e
lbnl-1908e
Other Subject(s)
Note
Published through SciTech Connect.
03/02/2009.
"lbnl-1908e"
Physical Review Letters 102 ISSN 0031-9007; PRLTAO FT
Kisielowski, Christian; Dahmen, Ulrich; Erni, Rolf P.; Rossell, Marta D.
Materials Sciences Division
Funding Information
DE-AC02-05CH11231
View MARC record | catkey: 14061496