FOURIER-TRANSFORM ANALYSIS OF NORMAL PHOTOELECTRON DIFFRACTION DATA FOR SURFACE-STRUCTURE DETERMINATION [electronic resource].
- Berkeley, Calif. : Lawrence Berkeley National Laboratory, 1980.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 13 pages : digital, PDF file
- Additional Creators:
- Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers could be determined with an accuracy of better than 2%.
- Report Numbers:
- E 1.99:lbl-11686
- Published through SciTech Connect.
Physical Review Letters FT
Hussain, Z.; Li, C. H.; Shirley, D. A.; Tong, S. Y.
Materials Sciences Division
- Funding Information:
View MARC record | catkey: 14062639