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FOURIER-TRANSFORM ANALYSIS OF NORMAL PHOTOELECTRON DIFFRACTION DATA FOR SURFACE-STRUCTURE DETERMINATION [electronic resource].

Published:
Berkeley, Calif. : Lawrence Berkeley National Laboratory, 1980.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:
13 pages : digital, PDF file
Additional Creators:
Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
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Summary:
A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers could be determined with an accuracy of better than 2%.
Report Numbers:
E 1.99:lbl-11686
lbl-11686
Subject(s):
Note:
Published through SciTech Connect.
10/01/1980.
"lbl-11686"
Physical Review Letters FT
Hussain, Z.; Li, C. H.; Shirley, D. A.; Tong, S. Y.
Materials Sciences Division
Funding Information:
DE-AC02-05CH11231
View MARC record | catkey: 14062639