Effect of the subgap conductance on the metastable states in a Josephson tunnel junction [electronic resource].
- Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1987.
- Physical Description:
- Pages: 3 : digital, PDF file
- Additional Creators:
- Argonne National Laboratory
United States. Department of Energy. Office of Scientific and Technical Information
- An investigation of the decay rate of metastable states in Josephson tunnel junctions in presence of thermal noise is presented. We have observed that, in the extremely underdamped regime, there is an exponential temperature dependence of the best fit value for the shunt conductance. Such a dependence shows a close relation with the temperature dependence of the subgap conductance, suggesting that the effective conductance for the escape from the metastable states obeys to a quasi-particle thermal activation mechanism. The introduction of this effective conductance into the lifetime expression for the zero-voltage states leads to significant changes in the width of the switching current distributions. A comparisons of the experimental data with the proposed model is reported. 7 refs., 2 figs.
- Published through SciTech Connect.
18. conference on low temperature physics, Kyoto, Japan, 20 Aug 1987.
Gray, K.E.; Pagano, S.; Cristiano, R.; Silvestrini, P.; Liengme, O.
Consiglio Nazionale delle Ricerche, Naples (Italy). Ist. di Cibernetica
- Funding Information:
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