Actions for X-ray microprobe for the microcharacterization of materials [electronic resource].

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X-ray microprobe for the microcharacterization of materials [electronic resource].

Published
Washington, D.C : United States. Dept. of Energy. Office of Energy Research, 1988.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
Pages: (11 pages) : digital, PDF file
Additional Creators
Oak Ridge National Laboratory, United States. Department of Energy. Office of Energy Research, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
The unique properties of x rays offer many advantages over those of electrons and other charged particles for the microcharacterization of materials. X rays are more efficient in exciting characteristic x-ray fluorescence and produce higher fluorescent signal-to-background ratios than obtained with electrons. Such x-ray microprobes will also produce unprecedentedly low levels of detection in diffraction, EXAFS, Auger, and photoelectron spectroscopies for structural and chemical characterization and elemental identification. These major improvements in microcharacterization capabilities will have wide-ranging ramifications not only in materials science but also in physics, chemistry, geochemistry, biology, and medicine. 24 refs., 6 figs., 2 tabs.
Report Numbers
E 1.99:conf-881155-44
conf-881155-44
Subject(s)
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Note
Published through SciTech Connect.
01/01/1988.
"conf-881155-44"
"DE89006038"
Fall meeting of the Materials Research Society, Boston, MA (USA), 28 Nov - 3 Dec 1988.
Ice, G.E.; Sparks, C.J.
Funding Information
AC05-84OR21400
View MARC record | catkey: 14065142