Materials science applications of a 120 kV FEG TEM/STEM [electronic resource] : Triskaidekaphilia
- Washington, D.C. : United States. Dept. of Energy, 1991. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- Pages: (2 pages) : digital, PDF file
- Additional Creators:
- Oak Ridge National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- The introduction by several manufacturers of 200kV transmission electron microscopes (TEM) equipped with field emission guns affords the opportunity to assess their potential impact on materials science by examining applications of similar 100-120kV instruments that have been in use for more than a decade. This summary is based on results from a Philips EM400T/FEG configured as an analytical electron microscope (AEM) with a 6,585 scanning transmission (STEM) unit, EDAX 9100/70 or 9900 energy dispersive X-ray spectroscopy (EDS) systems, and Gatan 607 serial- or 666 parallel-detection electron energy-loss spectrometers (EELS). Examples in four areas that illustrate applications that are impossible or so difficult as to be impracticable with conventional thermionic electron guns are described.
- Published through SciTech Connect., 01/01/1991., "conf-910870-7", "DE91010136", 49. Electron Microscopy Society of America (EMSA) annual meeting, San Jose, CA (USA), 4-9 Aug 1991., and Fisher, A.T.; Kenik, E.A.; Bentley, J.; Wang, Z.L.
- Funding Information:
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