Sensitivity Analysis of the DARHT-II 2.5MV/2kA Diode [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy, 2006.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Additional Creators:: United States. Department of Energy and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

This report summarizes the study of the tolerance limits on the assembly of the cathode and the Pierce electrode for the DARHT-II diode (2.5 MV, 2 kA case), performed through a series of computer simulations using the PIC code WARP [1]. We have considered sources of beam quality degradation like the errors in axial and transverse positioning, and the size of the radial gap between the cathode and the Pierce electrode (shroud). The figure of merit was chosen to be the RMS beam (edge) emittance at a distance of 1 meter from the cathode, as defined by {var_epsilon}ₓ = 4 βγ √(-²) ·. The analysis shows that to position the cathode at the correct axial and transverse location is more important than the size of the radial gap.

Report Numbers:

E 1.99:lbnl--62296
E 1.99: hifan 1562
hifan 1562
lbnl--62296

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Note:

Published through SciTech Connect.
12/22/2006.
"lbnl--62296"
" hifan 1562"
": AT5015031"
Henestroza, Enrique.
Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)

Funding Information:

DE-AC02-05CH11231
Z41003

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