Physico-chemical stability of solid surfaces [electronic resource] : Final report
- Washington, D.C. : United States. Dept. of Energy, 1998.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 12 pages : digital, PDF file
- Additional Creators:
- Sandia National Laboratories
United States. Department of Energy
United States. Department of Energy. Office of Scientific and Technical Information
- The application of physico-chemical phenomena to either increase machinability of hard materials, improve the wear resistance of cutting surfaces, or enhance sintering of particle compacts can have large economic impact on technologies ranging from materials forming processes to oil well drilling. Unfortunately, the broad application of these physico-chemical principles is limited by the authors ability to predict the optimum conditions for a wide variety of materials surfaces. Predictive models must be built upon understanding of the elementary events involved in surface damage and mobility. The authors have developed a new approach to examine the fundamental mechanisms controlling physico-chemical surface stability that combines: (1) atomic-scale control of surface contact forces and displacements under well controlled adsorbate conditions using the Interfacial Force Microscope, (2) atomic-level imaging of surface and near-surface structure and defects using Field Ion Microscopy, and (3) first-principles modeling of the effect of surface stress on adsorbate bonding interactions and the subsequent generation of surface damage. This unique combination of approaches has provided new insights into observed physico-chemical phenomena and provided the basis for developing true predictive models that are needed for wide application of these important new approaches to modifying the surface sensitive properties of materials.
- Published through SciTech Connect.
Houston, J.E.; Michalske, T.A.; Feibelman, P.J.; Kellogg, G.L.; Jennison, D.R.
- Funding Information:
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