Testing of CMOS Devices in NIF's Harsh Neutron Environment [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy, 2012.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:: PDF-file: 9 pages; size: 0.6 Mbytes
Additional Creators:: Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

Abstract not provided

Report Numbers:

E 1.99:llnl-conf-567712
llnl-conf-567712

Subject(s):

Engineering

Note:

Published through SciTech Connect.
07/16/2012.
"llnl-conf-567712"
Presented at: 2012 SPIE Conference, San Diego, CA, United States, Aug 12 - Aug 16, 2012.
Hagmann, C; Moody, J D; Burns, S; Bell, P M; Teruya, A T; Richardson, M.

Funding Information:

W-7405-ENG-48

View MARC record | catkey: 14102274