A Numerical Study on X-Ray Diffraction Effects within Objects [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 2005. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- PDF-file: 57 pages; size: 0 Kbytes
- Additional Creators:
- Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- X-rays, being waves, always undergo the propagation effects of reflection, refraction, diffraction, geometric attenuation and absorption. In most circumstances the first four effects are considered negligible given the resolution sizes demanded of the measurement systems, x-ray energies involved, and physical properties of the materials under evaluation. We have reached the point, however, in some x-ray non-destructive evaluation (NDE) and imaging where we wish to resolve features of micrometer size in millimeter size objects to less than micrometer resolution. Given this resolution and the sizes of the measurement systems, diffraction effects within the object may become observable. We studied the extent to which diffraction is observable numerically using a two-dimensional paraxial approximation wave propagation code using a multislice method. We modeled realistic parts of interest at worst-case x-ray energies, comparing wave propagation and straight-ray simulated results. In two cases, we compare the numerical results to experimental measurements. The conclusion, based upon the results of the simulation code, is that diffraction effects on the measured data will be insignificant. However, we demonstrate by a single example, that in certain cases diffraction effects may be significant.
- Published through SciTech Connect., 09/29/2005., "ucrl-tr-217063", and Lehman, S K.
- Funding Information:
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