High power, electron-beam induced switching in diamond [electronic resource].
- Published
- Washington, D.C. : United States. Dept. of Energy, 1993.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- 6 pages : digital, PDF file
- Additional Creators
- Lawrence Livermore National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- We are developing a high voltage, high average power, electron-beam controlled diamond switch that could significantly impact high power solid-state electronics in industrial and defense applications. An electron-beam controlled thin-film diamond could switch well over 100 kW average power at MHz frequencies, greater than 5 kV, and with high efficiency. This performance is due to the excellent thermal and electronic properties of diamond, the high efficiency achieved with electron beam control, and the demonstrated effectiveness of microchannel cooling. Our electron beam penetration depth measurements agree with our Monte-Carlo calculations. We have not observed electron beam damage in diamond for beam energies up to 150 keV. In this paper we describe our experimental and calculational results and research objectives.
- Report Numbers
- E 1.99:ucrl-jc--112023
E 1.99: conf-930616--37
conf-930616--37
ucrl-jc--112023 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
07/01/1993.
"ucrl-jc--112023"
" conf-930616--37"
"DE93040535"
9. IEEE pulsed power conference,Albuquerque, NM (United States),21-23 Jun 1993.
Brinkmann, R.P.; Scarpetti, R.D.; Joshi, R.P.; Kania, D.R.; Schoenbach, K.H.; Hofer, W.W.; Molina, C. - Funding Information
- W-7405-ENG-48
View MARC record | catkey: 14110988