Conductivity of thick film (cermet) resistors as a function of metallic particle volume fraction [electronic resource].
- Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1977.
- Physical Description:
- Pages: 11 : digital, PDF file
- Additional Creators:
- United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Thick film resistors are composites of metallic particles embedded in a glass matrix. Conduction is through interconnected particle chains. For each of five systems studied the conductivity varies over many decades with particle volume fraction. A model is proposed for which the conductance is indeed governed by percolation. This model takes explicit account of the resistor formation process and the observed microstructure. It is essentially a modified bond percolation model in which the metallic particles are partial bonds in the lattice connecting the interstices of the relatively larger, close-packed glass particles.
- Published through SciTech Connect., 01/01/1977., "sand-77-1042c", " conf-770925-1", Electrical transport and optical properties of inhomogeneous media conference, Columbus, OH, USA, 7 Sep 1977., Pike, G.E., and Sandia Labs., Albuquerque, NM (USA)
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