Actions for Using x-ray microprobes for environmental research [electronic resource].
Using x-ray microprobes for environmental research [electronic resource].
- Published
- Washington, D.C. : United States. Dept. of Energy, 1998.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- 13 pages : digital, PDF file
- Additional Creators
- Argonne National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- Understanding the fate of environmental contaminants is of fundamental importance in the development and evaluation of effective remediation strategies. Among the factors influencing the transport of these contaminants are the chemical speciation of the sample and the chemical and physical attributes of the surrounding medium. Characterization of the spatial distribution and chemical speciation at micron and submicron resolution is essential for studying the microscopic physical, geological, chemical, and biological interfaces that play a crucial role in determining contaminant fate and mobility. Hard X-ray spectroscopy and imaging are powerful techniques for the element-specific investigation of complex environmental samples at the needed micron and submicron resolution. An important advantage of these techniques results from the large penetration depth of hard X-rays in water. This minimizes the requirements for sample preparation and allows the detailed study of hydrated samples. This paper discusses some current problems in environmental science that can be addressed by using synchrotron-based X-ray imaging and spectroscopy. These concepts are illustrated by the results of recent X-ray microscopy studies at the Advanced Photon Source.
- Report Numbers
- E 1.99:anl/er/cp-95821
anl/er/cp-95821 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
07/30/1998.
"anl/er/cp-95821"
43rd Optical Science, Engineering, and Instrumentation Conference, San Diego, CA (US), 07/19/1998--07/24/1998.
Miller, R. M.; Lee, H.-R.; Lai, B.; Cai, Z.; Yun, W.; Jastrow, J.; Kemner, K. M.; Legnini, D. G.; Pratt, S. T.; Rodrigues, W. - Funding Information
- W-31109-ENG-38
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