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SRF Cavity Surface Topography Characterization Using Replica Techniques [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy. Office of Science, 2012.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Additional Creators
Thomas Jefferson National Accelerator Facility (U.S.), United States. Department of Energy. Office of Science, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
To better understand the roll of topography on SRF cavity performance, we seek to obtain detailed topographic information from the curved practical cavity surfaces. Replicas taken from a cavity interior surface provide internal surface molds for fine Atomic Force Microscopy (AFM) and stylus profilometry. In this study, we confirm the replica resolution both on surface local defects such as grain boundary and etching pits and compare the surface uniform roughness with the aid of Power Spectral Density (PSD) where we can statistically obtain roughness parameters at different scales. A series of sampling locations are at the same magnetic field chosen at the same latitude on a single cell cavity to confirm the uniformity. Another series of sampling locations at different magnetic field amplitudes are chosen for this replica on the same cavity for later power loss calculation. We also show that application of the replica followed by rinsing does not adversely affect the cavity performance.
Report Numbers
E 1.99:jlab-acc-12-1527
E 1.99: doe/or/23177-2279
doe/or/23177-2279
jlab-acc-12-1527
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Note
Published through SciTech Connect.
07/01/2012.
"jlab-acc-12-1527"
" doe/or/23177-2279"
IPAC 2012, 20-25 May 2012, New Orleans, Louisiana.
C. Xu, M.J. Kelley, C.E. Reece.
Funding Information
AC05-06OR23177
View MARC record | catkey: 14343249