Assessment of thermal analysis software for the DOE Office of Civilian Radioactive Waste Management [electronic resource].
- Oak Ridge, Tenn. : Oak Ridge National Laboratory, 1989.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Additional Creators:
- Oak Ridge National Laboratory
United States. Department of Energy. Office of Scientific and Technical Information
- This assessment uses several recent assessments and the more general code compilations that have been completed to produce a list of 116 codes that can be used for thermal analysis. This list is then compared with criteria prepared especially for the Department of Energy Office of Civilian Radioactive Waste Management (DOE/OCRWM). Based on these criteria, fifteen codes are narrowed to three primary codes and four secondary codes for use by the OCRWM thermal analyst. The analyst is cautioned that since no single code is sufficient for all applications, a code must be selected based upon the predominate heat transfer mode of the problem to be solved, but the codes suggested in this report have been used successfully for a range of OCRWM applications. The report concludes with a series of recommendations for additional work of which the major points include the following: The codes suggested by this report must be benchmarked with the existing US and international problems and validated when possible; An interactive code selection tool could be developed or, perhaps even more useful, a users group could be supported to ensure the proper selection of thermal codes and dissemination of information on the latest version; The status of the 116 codes identified by this report should be verified, and methods for maintaining the still active codes must be established; and special capabilities of each code in phase change, convection and radiation should be improved to better enable the thermal analyst to model OCRWM applications. 37 refs., 3 figs., 12 tabs.
- Published through SciTech Connect.
Williams, P.T.; Graham, R.F.; Lagerberg, G.N.; Chung, T.C.
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