%0 Generic %T Studies of hydrogen-induced degradation processes in Pb(Zr {sub 1-x}Ti{sub x})O{sub 3} (PZT) and SrBi{sub 2}Ta{sub 2}O{sub 9} SBT ferroelectric film-based capacitors %U http://www.osti.gov/servlets/purl/11192-J8QF3S/webviewable/