Actions for Characterization of poly(tetrafluoroethylene) surfaces by atomic force microscopy - results and artifacts [electronic resource].

Email RIS file
Bookmark
Report an Issue

Characterization of poly(tetrafluoroethylene) surfaces by atomic force microscopy - results and artifacts [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy, 1994.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
12 pages : digital, PDF file
Additional Creators
Sandia National Laboratories, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online

Availability

I Want It
I Want It

Finding items...

Restrictions on Access
Free-to-read Unrestricted online access
Summary
The surfaces of virgin and chemically etched poly(tetrafluoroethylene) (PTFE) have been studied using atomic force microscopy (AFM) in both contact and tapping modes. While attempting to perform AFM in contact mode on this relatively soft polymeric material, tip-induced imaging artifacts (presumably due to blunt tips and tip-to-surface interactions) were identified when the results were compared to scanning electron microscopy (SEM) surface images. When subsequent AFM imaging was performed in tapping mode it was apparent that these tip-induced artifacts were eliminated. Comparable tapping mode AFM and SEM images were obtained for even the highly porous, unstable surface that results from sodium naphthalenide etching of PTFE. AFM imaging in tapping mode of virgin and etched PTFE surfaces shows the three-dimensional character of the etched surface necessary for mechanical interlocking and resultant strong adhesion.
Report Numbers
E 1.99:sand--94-1129c
E 1.99: conf-9406268--1
conf-9406268--1
sand--94-1129c
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
10/01/1994.
"sand--94-1129c"
" conf-9406268--1"
"DE95000742"
Atomic force scanning tunneling microscopy symposium,Natick, MA (United States),7-9 Jun 1994.
Howard, A.J.; Rye, R.R.; Kjoller, K.
Funding Information
AC04-94AL85000
View MARC record | catkey: 14394366