Recent advances in segmented gamma scanner analysis [electronic resource].
- Los Alamos, N.M. : Los Alamos National Laboratory, 1987.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- Pages: 7 : digital, PDF file
- Additional Creators:
- Los Alamos National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- The segmented gamma scanner (SGS) is used in many facilities to assay low-density scrap and waste generated in the facilities. The procedures for using the SGS can cause a negative bias if the sample does not satisfy the assumptions made in the method. Some process samples do not comply with the assumptions. This paper discusses the effect of the presence of lumps on the SGS assay results, describes a method to detect the presence of lumps, and describes an approach to correct for the lumps. Other recent advances in SGS analysis are also discussed.
- Report Numbers:
- E 1.99:la-ur-87-3954
E 1.99: conf-871110-9
- Other Subject(s):
- Published through SciTech Connect.
3. international conference on facility operations safeguards interface, San Diego, CA, USA, 29 Nov 1987.
Hsue, S.T.; Sprinkle, J.K. Jr.
- Funding Information:
View MARC record | catkey: 14396818