Improved detection limits in energy dispersive x-ray fluorescence analysis, using polarized x rays [electronic resource].
- Livermore, Calif. : Lawrence Livermore Laboratory, 1976. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- Pages: 17 : digital, PDF file
- Additional Creators:
- Lawrence Livermore Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Polarized x-radiation is shown to be a superior and practical excitation source for measuring trace elements by energy dispersive x-ray fluorescence. In this study, polarization was obtained by scattering the primary beam at 90/sup 0/ from boron carbide. The losses inherent in the geometric requirements and the polarizer efficiency can be more than compensated for by using a close-coupled system and a standard, high-power x-ray tube. With the system described here, which uses a molybdenum anode x-ray tube, detection limits for the elements from K to Sr in NBS Standard Orchard Leaves are approximately 2 to 4.5 times lower using polarized excitation as compared to direct excitation, and about 1 to 3 times lower as compared to secondary excitation.
- Published through SciTech Connect., 09/09/1976., "ucrl-78063(rev.1)", " conf-760857-2", 25. annual x-ray conference, Denver, CO, USA, 3 Aug 1976., and Ryon, R.W.
- Funding Information:
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