X-ray fluorescence spectrometers [electronic resource] : a comparison of wavelength and energy dispersive instruments

Published: Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1977.
Physical Description: Pages: 21 : digital, PDF file
Additional Creators: United States. Department of Energy. Office of Scientific and Technical Information

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Summary

Wavelength dispersive and energy dispersive x-ray fluorescence spectrometers are compared. Separate sections are devoted to principles of operation, sample excitation, spectral resolution, and x-ray detection. Tabulated data from the literature are cited in the comparison of accuracy, precision, and detection limits. Spectral interferences and distortions are discussed. Advantages and limitations are listed for simultaneous wavelength dispersive spectrometers, sequential wavelength dispersive spectrometers, and Si(Li) energy dispersive spectrometers. Accuracy, precision, and detection limits are generally superior for wavelength dispersive spectrometers.

Report Numbers

E 1.99:dp-1462
dp-1462

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Note

Published through SciTech Connect.
11/01/1977.
"dp-1462"
Slates, R.V.
Du Pont de Nemours (E.I.) and Co., Aiken, S.C. (USA). Savannah River Lab.

Funding Information

EY-76-C-09-0001

View MARC record | catkey: 14397783