Integrated X-Ray Reflectivity Measurements for Elliptically Curved PET Crystals [electronic resource].
- Washington, D.C. : United States. National Nuclear Security Administration, 2012. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Additional Creators:
- United States. National Nuclear Security Administration and United States. Department of Energy. Office of Scientific and Technical Information
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- Free-to-read Unrestricted online access
- Spectroscopy provides valuable information about the temperature and density of a compressed pellet in a plasma. Elliptically curved pentaerythritol (PET) crystals are used as components for spectrometers. Their elliptical geometry gives several advantages related to spectral energy range, source focus, and spectral image compression. The crystal curvature increases the spectrometer throughput but at the cost of a loss in resolution. Four different crystals are used in a spectrometer at the National Ignition Facility (NIF) target chamber at Lawrence Livermore National Laboratory (LLNL). Figure 1 shows the arrangement of the elliptical PET crystals in the snout of a NIF target diagnostic shown in Figure 2. The spectrum from the crystals is captured by four image plates located behind the crystals. A typical mandrel, the darkened section, upon which the PET crystal is glued, is shown in Figure 3, which also shows the complete ellipse. There are four elliptical segment types, each having the same major axis but a different minor axis. The crystals are 150 mm long in the diffraction direction and 25.4 mm high. Two crystals of each type were calibrated. The throughput for each spectrometer is determined by the integrated reflectivity of the PET crystal. The goal of this effort was to measure the reflectivity curve of the PET curved crystal at several energies and determine the integrated reflectivity and the curve width as a function of the X-ray spectral energy and location on the ellipse where the beam strikes.
- Published through SciTech Connect., 04/26/2012., "doe/nv/25946--1500", 19th Topical Conference: High-Temperature Plasma Diagnostics., Barrios, M A; Haugh, M J; Ross, P W; Emig, J A; Magoon, J; Shoup, M J; Regan, P W., and Nevada Test Site/National Security Technologies, LLC (United States)
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