Calibrating X-ray Imaging Devices for Accurate Intensity Measurement [electronic resource].
- Washington, D.C. : United States. National Nuclear Security Administration, 2011. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Additional Creators:
- United States. National Nuclear Security Administration and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- The purpose of the project presented is to develop methods to accurately calibrate X-ray imaging devices. The approach was to develop X-ray source systems suitable for this endeavor and to develop methods to calibrate solid state detectors to measure source intensity. NSTec X-ray sources used for the absolute calibration of cameras are described, as well as the method of calibrating the source by calibrating the detectors. The work resulted in calibration measurements for several types of X-ray cameras. X-ray camera calibration measured efficiency and efficiency variation over the CCD. Camera types calibrated include: CCD, CID, back thinned (back illuminated), front illuminated.
- Published through SciTech Connect., 07/28/2011., "doe/nv/25946--1283", Denver X-ray Conference, Denver, Colorado, August 1, 2011., Haugh, M. J., and Nevada Test Site/National Security Technologies, LLC (United States)
- Funding Information:
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