Actions for Electronic discrimination of the effective thickness of proportional counters. [Gamma camera] [electronic resource].
Electronic discrimination of the effective thickness of proportional counters. [Gamma camera] [electronic resource].
- Published
- Oak Ridge, Tenn. : Oak Ridge National Laboratory, 1976.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- Pages: 6 : digital, PDF file
- Additional Creators
- Oak Ridge National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- A new method of electronic discrimination of the effective thickness of proportional counters was developed and tested and applied in a proportional counter camera to adjust its effective aperture, i.e., the combination of counter efficiency and spatial resolution, without changing the pinhole aperture, the collimator, or the distance between the subject and camera. The discriminator virtually divides the thickness of the electronic drift volume of the camera into two regions and separates the photons detected in each region. Thus, two sets of data are acquired and displayed simultaneously during an exposure: one with good spatial resolution (less than 2 mm fwhm) using photons detected in the drift volume close to the entrance window, and one with high detection efficiency (greater than 50 percent for 60-keV photons) but poorer resolution (approximately 5 mm fwhm) using all detected photons. Simultaneous acquisition of two sets of data with different apertures reduces the exposure time in applications, such as nuclear medicine, where a sequence of images often is required to select the optimum aperture for different portions of radioisotope distribution images.
- Report Numbers
- E 1.99:conf-761006-20
conf-761006-20 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
01/01/1976.
"conf-761006-20"
Nuclear science, scintillation and semiconductor counter symposium, New Orleans, LA, USA, 20 Oct 1976.
Kopp, M.K.; Borkowski, C.J. - Funding Information
- W-7405-ENG-26
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