Relevance of fcc-bcc interface structure to defect properties at interfaces in irradiation environment [electronic resource].
Published
Washington, D.C. : United States. Dept. of Energy, 2011. Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
E 1.99:la-ur-11-01305 E 1.99: la-ur-11-1305 la-ur-11-1305 la-ur-11-01305
Note
Published through SciTech Connect. 02/24/2011. "la-ur-11-01305" " la-ur-11-1305" 2011 TMS Annual Meeting & Exhibition ; February 27, 2011 ; San Diego, CA. Hoagland, Richard G; Hirth, John P; Misra, Amit; Nastasi, Michael; Uberuaga, Blas P; Liu, Xiang-yang; Bai, Xianming; Demkowicz, Michael J.