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Automated Data Collection for Determining Statistical Distributions of Module Power Undergoing Potential-Induced Degradation [electronic resource] : Preprint

Published:
Washington, D.C. : United States. Dept. of Energy. Office of Solar Electric Technology, 2014.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:
8 pages : digital, PDF file
Additional Creators:
National Renewable Energy Laboratory (U.S.), United States. Department of Energy. Office of Solar Electric Technology, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary:
We propose a method for increasing the frequency of data collection and reducing the time and cost of accelerated lifetime testing of photovoltaic modules undergoing potential-induced degradation (PID). This consists of in-situ measurements of dark current-voltage curves of the modules at elevated stress temperature, their use to determine the maximum power at 25 degrees C standard test conditions (STC), and distribution statistics for determining degradation rates as a function of stress level. The semi-continuous data obtained by this method clearly show degradation curves of the maximum power, including an incubation phase, rates and extent of degradation, precise time to failure, and partial recovery. Stress tests were performed on crystalline silicon modules at 85% relative humidity and 60 degrees C, 72 degrees C, and 85 degrees C. Activation energy for the mean time to failure (1% relative) of 0.85 eV was determined and a mean time to failure of 8,000 h at 25 degrees C and 85% relative humidity is predicted. No clear trend in maximum degradation as a function of stress temperature was observed.
Report Numbers:
E 1.99:nrel/cp-5j00-62468
nrel/cp-5j00-62468
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Note:
Published through SciTech Connect.
08/01/2014.
"nrel/cp-5j00-62468"
Presented at the 24th Workshop on Crystalline Silicon Solar Cells & Modules: Materials and Processes, 27-30 July 2014, Breckenridge, Colorado.
Hacke, P.; Spataru, S.
Funding Information:
AC36-08GO28308
View MARC record | catkey: 14443660