Measurement of transverse Jc profiles of coated conductors using a magnetic knife of permanent magnets [electronic resource].

Published: Washington, D.C. : United States. Dept. of Energy, 2008.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Additional Creators: Los Alamos National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary

The transverse J{sub c} distribution in YBCO coated conductors was measured non-destructively with high resolution using a 'magnetic knife' made of permanent magnets. The method utilizes the strong depression of J{sub c} in applied magnetic fields. A narrow region of low (including zero) magnetic field, in a surrounding higher field, is moved transversely across the sample in order to reveal the critical-current density distribution. The net resolution of this device is approximately 65 {micro}m, and the J{sub c} resolution is better than 0.5%. A Fourier series inversion process was used to determine the transverse J{sub c} distribution in the sample. The J{sub c} profile was correlated with other sample properties of coated conductors prepared by pulsed laser deposition. Because of its straight-forward and inexpensive design, this J{sub c} imaging technique can be a powerful tool for quality control in coated-conductor production.

Report Numbers

E 1.99:la-ur-08-04353
E 1.99: la-ur-08-4353
la-ur-08-4353
la-ur-08-04353

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Note

Published through SciTech Connect.
01/01/2008.
"la-ur-08-04353"
" la-ur-08-4353"
Applied Physics Letters ISSN 0003-6951; APPLAB FT
Coulter, J Y; Mueller, F M; Ashworth, S P; Haenisch, J; Matias, Vlad.

Funding Information

AC52-06NA25396

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