Actions for NANOSECOND INTERFEROMETRIC STUDIES OF SURFACE DEFORMATIONS OF DIELECTRICS INDUCED BY LASER IRRADIATION [electronic resource].
NANOSECOND INTERFEROMETRIC STUDIES OF SURFACE DEFORMATIONS OF DIELECTRICS INDUCED BY LASER IRRADIATION [electronic resource].
- Published
- Washington, D.C. : United States. Dept. of Energy, 2000.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- 12 pages : digital, PDF file
- Additional Creators
- Los Alamos National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- Transient surface deformations in dielectric materials induced by laser irradiation were investigated with time-resolved interferometry. Deformation images were acquired at various delay times after exposure to single pulses (100 ps at 1.064 {micro}m) on fresh sample regions. Above the ablation threshold, we observe prompt ejection of material and the formation of a single unipolar compressional surface acoustic wave propagating away from the ablation crater. For calcite, no deformation--either transient or permanent--is discernable at laser fluences below the threshold for material ejection. Above and below-threshold behavior was investigated using a phosphate glass sample with substantial near infrared absorption (Schott filter KG3). Below threshold, KG3 exhibits the formation of a small bulge roughly the size of the laser spot that reaches its maximum amplitude by ≈5 ns. By tens of nanoseconds, the deformations become quite complex and very sensitive to laser fluence. The above-threshold behavior of KG3 combines the ablation-induced surface acoustic wave seen in calcite with the bulge seen below threshold in KG3. A velocity of 2.97 ± 0.03 km/s is measured for the KG3 surface acoustic wave, very close to the Rayleigh wave velocity calculated from material elastic parameters. Details of the transient interferometry system will also be given.
- Report Numbers
- E 1.99:la-ur-00-2296
la-ur-00-2296 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
05/01/2000.
"la-ur-00-2296"
Conference title not supplied, Conference location not supplied, Conference dates not supplied.
ET AL; S. GREENFIELD. - Funding Information
- W-7405-ENG-36
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