Email RIS file
Bookmark
Report an Issue

Stress Induced Degradation Modes in CIGSS Minimodules (Presentation) [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy, 2008.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
18 pages : digital, PDF file
Additional Creators
National Renewable Energy Laboratory (U.S.), United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online

Availability

I Want It
I Want It

Finding items...

Restrictions on Access
Free-to-read Unrestricted online access
Summary
The experimental objectives of this report are: (1) compare the performance of modules exposed to high temperature and humidity; (2) determine the effects of different encapsulants on long term stability of CIGSS modules; and (3) analyze failure modes to determine areas in need of improvement.
Report Numbers
E 1.99:nrel/pr-520-43310
nrel/pr-520-43310
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
05/01/2008.
"nrel/pr-520-43310"
Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California.
Tarrant, D.; Terwilliger, K.; Kempe, M. D.
Funding Information
AC36-99-GO10337
View MARC record | catkey: 14445890