A Superbend X-Ray Microdiffraction Beamline at the Advanced Light Source [electronic resource].

Published: Berkeley, Calif. : Lawrence Berkeley National Laboratory. Advanced Light Source, 2009.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Additional Creators: Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory. Advanced Light Source, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary

Beamline 12.3.2 at the Advanced Light Source is a newly commissioned beamline dedicated to x-ray microdiffraction. It operates in both monochromatic and polychromatic radiation mode. The facility uses a superconducting bending magnet source to deliver an X-ray spectrum ranging from 5 to 22 keV. The beam is focused down to ≈ 1 um size at the sample position using a pair of elliptically bent Kirkpatrick-Baez mirrors enclosed in a vacuum box. The sample placed on high precision stages can be raster-scanned under the microbeam while a diffraction pattern is taken at each step. The arrays of diffraction patterns are then analyzed to derive distribution maps of phases, strain/stress and/or plastic deformation inside the sample.

Report Numbers

E 1.99:lbnl-1807e
lbnl-1807e

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Note

Published through SciTech Connect.
03/10/2009.
"lbnl-1807e"
Materials Science and Engineering A FT
Tamura, N.; Chen, K.; Warwick, T.; Kunz, M.; MacDowell, A.A.; Celestre, R.S.

Funding Information

DE-AC02-05CH11231

View MARC record | catkey: 14446074