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Determination of near-surface material properties by line-focus acoustic microscopy [electronic resource].

Published
Argonne, Ill. : Argonne National Laboratory, 1996.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
pages 75-82 : digital, PDF file
Additional Creators
Argonne National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
A line-focus acoustic microscope is used in conjunction with a multiple wave-mode method to determine elastic constants from a single V(z) measurement. V(z) curves which include contributions from different wave modes, measured using the line-focus acoustic microscope at 225 MHz, have been compared with theoretical results predicted by a V(z) measurement model. The determination of elastic constants has been achieved numerically by seeking a set of elastic constants that leads to the best fit, in the least square sense, of the theoretical results to the experimental ones. The method has been applied to isotropic materials in bulk, and plate and thin-film configurations. Elastic constants for each of these cases have been determined. The consistency, convergence, sensitivity and accuracy of the procedure have been investigated.
Report Numbers
E 1.99:conf-9605186--
conf-9605186--
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Note
Published through SciTech Connect.
12/31/1996.
"conf-9605186--"
"DE96015339"
14. symposium on energy engineering sciences: mechanical sciences, Argonne, IL (United States), 15-17 May 1996.
Achenbach, J.D.; Li, W.
Funding Information
FG02-86ER13484
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