Actions for Characterization of SiC fibers by soft x-ray photoelectron and photoabsorption spectroscopies and scanning Auger microscopy [electronic resource].

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Characterization of SiC fibers by soft x-ray photoelectron and photoabsorption spectroscopies and scanning Auger microscopy [electronic resource].

Published
Arlington, Va. : National Science Foundation (U.S.), 1996.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
8 pages : digital, PDF file
Additional Creators
Argonne National Laboratory, National Science Foundation (U.S.), and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
Synchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers produced by CVD on a W core and followed by a C passivating layer. Depth profiling of the fiber through the C/SiC interface was done by making Si 2p and C 1s core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar⁺ sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed versus depth, indicating no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominantely graphite-like and those of the CVD SiC coatings are microcrystalline, with disorder present to some extent in both cases.
Report Numbers
E 1.99:anl/aps/cp--90604
E 1.99: conf-960401--67
conf-960401--67
anl/aps/cp--90604
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
08/01/1996.
"anl/aps/cp--90604"
" conf-960401--67"
"DE96013466"
": NSF Grant DMR 8821625"
Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996.
McDowell, M.W.; Rosenberg, R.A.; Ma, Qing.
Funding Information
W-31109-ENG-38
View MARC record | catkey: 14448811