Silicon Heterojunction Solar Cell Characterization and Optimization Using In Situ and Ex Situ Spectroscopic Ellipsometry (Presentation) [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy, 2006.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:: 17 pages : digital, PDF file
Additional Creators:: National Renewable Energy Laboratory (U.S.), United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

The summary of this report is that: in situ SE gives insight into growth mechanisms and accurate layer thickness; (2) ex situ SE measures completed device structures to determine integrated optical properties; and (3) the combination of in situ and ex situ SE provides a powerful method for pinpointing the effects of processing changes in actual SHJ devices and guiding optimization.

Report Numbers:

E 1.99:nrel/pr-520-39986
nrel/pr-520-39986

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Note:

Published through SciTech Connect.
05/01/2006.
"nrel/pr-520-39986"
Prepared for the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4), 7-12 May 2006, Waikoloa, Hawaii.
Page, M.; Branz, H.; Levi, D.; Iwaniczko, E.; Wang T.

Funding Information:

AC36-99-GO10337

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