Ambient-pressure silica aerogel films [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1994. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 7 pages : digital, PDF file
- Additional Creators:
- Sandia National Laboratories, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Very highly porous (aerogel) silica films with refractive index in the range 1.006--1.05 (equivalent porosity 98.5--88%) were prepared by an ambient-pressure process. It was shown earlier using in situ ellipsometric imaging that the high porosity of these films was mainly attributable to the dilation or `springback` of the film during the final stage of drying. This finding was irrefutably reconfirmed by visually observing a `springback` of >500% using environmental scanning electron microscopy (ESEM). Ellipsometry and ESEM also established the near cent per cent reversibility of aerogel film deformation during solvent intake and drying. Film thickness profile measurements (near the drying line) for the aerogel, xerogel and pure solvent cases are presented from imaging ellipsometry. The thickness of these films (crack-free) were controlled in the range 0.1-3.5 μm independent of refractive index.
- Published through SciTech Connect., 12/31/1994., "sand--95-0350c", " conf-941144--87", "DE95008161", Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994., and Hurd, A.J.; Brinker, C.J.; Prakash, S.S.
- Funding Information:
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