TIME-RESOLVED X-RAY DIFFRACTION MEASUREMENTS ON SHOCKED LIF CRYSTALS [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 2001. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 4 pages : digital, PDF file
- Additional Creators:
- Los Alamos National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Time-resolved x-ra:y diffraction measurements were carried out on shock-compressed LiF single crystals in plate impact experiments for the first time. Data (2-4 ns resolution) were obtained using an x-ray streak camera firom crystals subjected to both shock and ramp wave loading along the  direction. Because of the penetration depth of the x-rays into the sample, interpretation of the ramp wave loading data required an analytic model to simulate the results. The penetration depth used in this model was determined experimentally from the time-resolved shock wave loading data. Good agreement between the simulations and experimental data was found for both loading conditions, suggesting that the analytic model has broad applicability. Analytic developments and the implications of our results will be discussed.
- Published through SciTech Connect., 01/01/2001., "la-ur-01-3363", Submitted to: Shock Compression of Condensed Matter--2001: Proceedings of the Conference of the APS Topical Group on Shock Compression of Condensed Matter held at Atlanta, GA, June 2001., and Rigg, P. A.; Zimmerman, K. A.; Gupta, Y. M.
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