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New experimental and analysis methods in I-DLTS [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy. Office of Energy Research, 1998.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
13 pages : digital, PDF file
Additional Creators
Brookhaven National Laboratory, United States. Department of Energy. Office of Energy Research, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
A new experimental apparatus to perform I-DLTS measurements is presented. The method is shown to be faster and more sensitive than traditional double boxcar I-DLTS systems. A novel analysis technique utilizing multiple exponential fits to the I-DLTS signal from a highly neutron irradiated silicon sample is presented with a discussion of the results. It is shown that the new method has better resolution and can deconvolute overlapping peaks more accurately than previous methods.
Report Numbers
E 1.99:bnl--65290
E 1.99: conf-980355--
conf-980355--
bnl--65290
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
02/01/1998.
"bnl--65290"
" conf-980355--"
"DE98004440"
2. international conference on radiation effects on semiconductor materials, detectors and devices, Florence (Italy), 4-6 Mar 1998.
Li, Z.; Eremin, V.; Pandey, S.U.; Middelkamp, P.
Funding Information
AC02-76CH00016
View MARC record | catkey: 14450361