The influence of vortex pinning and grain boundary structure on critical currents across grain boundaries in YBa{sub 2}Cu{sub 3}O{sub x} [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy, 1998.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:: 7 pages : digital, PDF file
Additional Creators:: Argonne National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

We have used studies of single grain boundaries in YBCO thin films and bulk bicrystals to study the influence of vortex pinning along a grain boundary on dissipation. The critical current density for transport across grain boundaries in thin films is typically more than an order of magnitude larger than that measured for transport across grain boundaries in bulk samples. For low disorientation angles, the difference in critical current density within the grains that form the boundary can contribute to the substantial differences in current density measured across the boundary. However, substantial differences exist in the critical current density across boundaries in thin film compared to bulk bicrystals even in the higher angle regime in which grain boundary dissipation dominates. The differences in critical current density in this regime can be understood on the basis of vortex pinning along the boundary.

Report Numbers:

E 1.99:anl/msd/cp-97512
anl/msd/cp-97512

Subject(s):

Materials Science

Other Subject(s):

Note:

Published through SciTech Connect.
10/27/1998.
"anl/msd/cp-97512"
1998 Applied Superconductivity Conference, Palm Desert, CA (US), 09/13/1998--09/18/1998.
Miller, D. J.

Funding Information:

W-31109-ENG-38

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