Seeing atoms only 0.78A apart [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy. Office of Basic Energy Sciences, 2001.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:: vp : digital, PDF file
Additional Creators:: Lawrence Berkeley National Laboratory, United States. Department of Energy. Office of Basic Energy Sciences, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

The one-Angstrom microscope (OAM) project at the USDOE's National Center for Electron Microscopy has extended the limits of high-resolution transmission electron microscopy to sub-Angstrom levels. The OAM combines image-processing software with a modified 300keV electron microscope equipped with a highly-coherent field-emission electron gun. We have found that a reduction in the OAM's electron-gun extraction voltage allows us to ''see'' silicon atoms separated by only 0.78A.

Report Numbers:

E 1.99:lbnl--52325
lbnl--52325

Subject(s):

Materials Science

Other Subject(s):

Note:

Published through SciTech Connect.
03/14/2001.
"lbnl--52325"
Nelson, E.C.; O'Keefe, M.A.

Type of Report and Period Covered Note:

Topical;

Funding Information:

AC03-76SF00098
503836

View MARC record | catkey: 14451695