Actions for Recombination Lifetimes Using the RCPCD Technique [electronic resource] : Comparison with Other Methods

Email RIS file
Bookmark
Report an Issue

Recombination Lifetimes Using the RCPCD Technique [electronic resource] : Comparison with Other Methods

Published
Washington, D.C. : United States. Dept. of Energy, 2005.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
5 pages : digital, PDF file
Additional Creators
National Renewable Energy Laboratory (U.S.), United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online

Availability

I Want It
I Want It

Finding items...

Restrictions on Access
Free-to-read Unrestricted online access
Summary
The theory and operation of the resonance-coupled photoconductive decay (RCPCD) technique is described. Examples are presented of data measured on a wide variety of sample types. The RCPCD technique has been applied to a variety of wafer and thin-film materials. Using this technique, we can measure recombination lifetime over at least three decades of injection level. We can also measure relative values of minority-carrier mobility and diffusion length. By scanning the excitation wavelength, we can measure spectral response and photoconductive excitation spectra. Deep-level impurities have been detected by several variations of RCPCD.
Report Numbers
E 1.99:nrel/cp-520-37084
nrel/cp-520-37084
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
01/01/2005.
"nrel/cp-520-37084"
Ahrenkiel, R.K.; Johnston, S.W.; Dashdorj, J.
Funding Information
AC36-99-GO10337
View MARC record | catkey: 14453188