Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluorescence [electronic resource] : Preprint
- Washington, D.C. : United States. Dept. of Energy, 2001.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 4 pages : digital, PDF file
- Additional Creators:
- United States. Department of Energy and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in a series of CdS/Zn₂SnO₄ junctions has been investigated by using the method of Angular Dependence of X-ray Fluorescence (ADXRF). Samples of CdS, Zn₂SnO₄ (ZTO), and CdS/ZTO junctions were grown on glass, followed by different annealing processes. Special attention is directed to a comparison of samples heat-treated in argon and in CdCl₂ at different temperatures. It has been found that different heat treatment conditions can result in drastic variations in the density distribution of the constituents in the system.
- Report Numbers:
- E 1.99:nrel/cp-520-31024
- Other Subject(s):
- Published through SciTech Connect.
Presented at the NCPV Program Review Meeting, Lakewood, CO (US), 10/14/2001--10/17/2001.
Kim, S.; Wu, X.; Kao, Y.H.; Soo, Y.L.; Kioseoglou, G.
National Renewable Energy Lab., Golden, CO. (US)
- Funding Information:
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