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A new approach to texture measurements [electronic resource] : Orientation distribution function (ODF) determination by Rietveld refinement

Published
Washington, D.C. : United States. Dept. of Energy, 1996.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
6 pages : digital, PDF file
Additional Creators
Los Alamos National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
The preferred orientation of crystal grains within a manufactured part is described most fully by its orientation distribution function (ODF), which is a mapping of the probability of each of the possible grain orientations with respect to the exterior dimensions. Traditionally, an ODF is determined from pole figures for a relatively small number of reflections. These pole figures are measured with x-rays or neutrons using short detector scans over the center of an individual diffraction peak for a large number of different sample orientations. This is efficient if the selected diffraction peaks are reasonably strong (relative to background) and well separated, such as in pure fcc and bcc metals. It is also appropriate for constant wavelength sources where collection of individual diffraction peak intensities is a reasonably efficient use of the source. However, the traditional method is not very efficient for neutron diffraction at a spallation source such as LANSCE where the entire diffraction pattern is accessible for each sample setting. Moreover, a different approach is necessary for complicated diffraction patterns, such as from composite materials, intermetallic compounds, high {Tc} ceramics, polyphasic minerals and polymers where there is expected to be heavy overlap of adjacent diffraction peaks. In addition, the large number of settings normally collected for an individual pole figure may not be necessary, since the entire pattern is obtained at each setting. Thus, a new method of ODF analysis needs to be developed to handle the more complex diffraction patterns obtained from modern technological materials as well as take advantage of the particular characteristics of spallation neutron sources. This project sought to develop the experimental procedures and the mathematical treatment needed to produce an orientation distribution function (ODF) directly from full diffraction patterns from a sample in a limited number of orientations.
Report Numbers
E 1.99:la-ur--96-2820
la-ur--96-2820
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Other Subject(s)
Note
Published through SciTech Connect.
09/01/1996.
"la-ur--96-2820"
"DE96014572"
Larson, A.; Wright, S.; Sheldon, R.; Lawson, A.; Vondreele, R.
Funding Information
W-7405-ENG-36
View MARC record | catkey: 14454682